Origin of infrared bands in neutron-irradiated silicon
作者:
N. V. Sarlis,
C. A. Londos,
L. G. Fytros,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 81,
issue 4
页码: 1645-1650
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.364020
出版商: AIP
数据来源: AIP
摘要:
Infrared absorption measurements were made of the localized vibrational modes due to defects produced in Czochralski-grown Si material after irradiation with fast neutrons and subsequent thermal treatments. The investigation was focused, in particular, on three satellite bands in the region of the A center, located at 839, 833 and 824 cm−1respectively, the annealing behavior of which was carefully monitored. Correlation of our results with previous infrared, electron paramagnetic resonance and positron annihilation studies favors attributing these bands to theV2O,V3O2and V2O2defects respectively. In addition, semiempirical calculations were carried out for the vibrational frequencies of these defects, and the predicted values are in agreement with the above assignments. ©1997 American Institute of Physics.
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