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Electron‐beam plasma enhancement of oxidation in thin aluminum samples

 

作者: Todd Schneider,   Miles Baron,   Dave Edwards,   Rex Gandy,   J. Fukai,  

 

期刊: Journal of Applied Physics  (AIP Available online 1990)
卷期: Volume 67, issue 3  

页码: 1601-1602

 

ISSN:0021-8979

 

年代: 1990

 

DOI:10.1063/1.345645

 

出版商: AIP

 

数据来源: AIP

 

摘要:

In order to gain an insight into the effects of a space environment on materials, thin aluminum samples were exposed to an oxygen plasma produced by an electron beam. Using Rutherford backscattering spectrometry the samples exposed to the oxygen plasma were compared to samples exposed to ordinary oxygen gas. The comparison revealed a considerable increase in oxygen diffusion in the samples exposed to the charged particle environment. The amount of oxygen diffusion depends on the duration of the plasma exposure.

 

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