Electron‐beam plasma enhancement of oxidation in thin aluminum samples
作者:
Todd Schneider,
Miles Baron,
Dave Edwards,
Rex Gandy,
J. Fukai,
期刊:
Journal of Applied Physics
(AIP Available online 1990)
卷期:
Volume 67,
issue 3
页码: 1601-1602
ISSN:0021-8979
年代: 1990
DOI:10.1063/1.345645
出版商: AIP
数据来源: AIP
摘要:
In order to gain an insight into the effects of a space environment on materials, thin aluminum samples were exposed to an oxygen plasma produced by an electron beam. Using Rutherford backscattering spectrometry the samples exposed to the oxygen plasma were compared to samples exposed to ordinary oxygen gas. The comparison revealed a considerable increase in oxygen diffusion in the samples exposed to the charged particle environment. The amount of oxygen diffusion depends on the duration of the plasma exposure.
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