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Rish Assessment Of High-Voltage Insulation Based On Stochastic Modelling

 

作者: PraxlG.,   MoretR.,  

 

期刊: International Journal of Modelling and Simulation  (Taylor Available online 1983)
卷期: Volume 3, issue 3  

页码: 159-162

 

ISSN:0228-6203

 

年代: 1983

 

DOI:10.1080/02286203.1983.11759837

 

出版商: Taylor&Francis

 

数据来源: Taylor

 

摘要:

AbstractDesigning high-voltage insulation it is a main prohlem to determine the withstand voltage and the minimum life time. As a rule extrapolation hased on experimental mean values and variances (e.g. Three-Sigma Law) is used for determining the respective voltage level or life-time. For practical reasons only a limited numher of voltage tests may be carried out. Therefore the experimental results of small sample sizes are only the most probable inference of the actual values. Given a normal or transformed normal distribution of the measured values diagrams of the tolerance limits for the actual withstand voltage and minimum life-time have been developed using the non-central t-distribution. The application of this stochastic modelling technique permits a much preciser determination of the tolerance limits than the Kolmogorov-Smirnov goodness of fit test or conventional worst case design based on the central-t and Chi2-distribution.

 

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