Nanoscale imaging of domain dynamics and retention in ferroelectric thin films
作者:
A. Gruverman,
H. Tokumoto,
A. S. Prakash,
S. Aggarwal,
B. Yang,
M. Wuttig,
R. Ramesh,
O. Auciello,
T. Venkatesan,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 71,
issue 24
页码: 3492-3494
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.120369
出版商: AIP
数据来源: AIP
摘要:
We report results on the direct observation of the microscopic origins of backswitching in ferroelectric thin films. The piezoelectric response generated in the film by a biased atomic force microscope tip was used to obtain static and dynamic piezoelectric images of individual grains in a polycrystalline material. We demonstrate that polarization reversal occurs under no external field (i.e., loss of remanent polarization) via a dispersive continuous-time random walk process, identified by a stretched exponential decay of the remanent polarization. ©1997 American Institute of Physics.
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