Lα/Lβ; and Lα/Lγx‐ray intensity ratios for elements in the rangeZ= 55–80
作者:
C. V. Raghavaiah,
N. Venkateswara Rao,
S. Bhuloka Reddy,
G. Satyanarayana,
G. Sree Krishna Murty,
M. V. S. Chandrasekhar Rao,
D. L. Sastry,
期刊:
X‐Ray Spectrometry
(WILEY Available online 1990)
卷期:
Volume 19,
issue 1
页码: 23-26
ISSN:0049-8246
年代: 1990
DOI:10.1002/xrs.1300190105
出版商: Wiley Subscription Services, Inc., A Wiley Company
数据来源: WILEY
摘要:
AbstractA systematic study of Lα/Lβand Lα/Lγx‐ray intensity ratios was undertaken by measuring the characteristic x‐ray intensities in 23 elements over the rangeZ= 55‐80, using a 30 mCi238Pu source of excitation and a high‐resolution Si(Li) detector system coupled to a computer‐controlled multi‐channel analyser. The theoretical predictions due to Scofield were computed for the present energy (weighted average) of 15.28 keV excitation and compared with the experimental values. The experimental values of Lα/Lβand Lα/LγversusZwere fitted to a fourth‐degree polynomial, and most probable values of Lα/Lβand Lα/Lγat eachZwere also
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