Cavity characteristics of selectively oxidized vertical‐cavity lasers
作者:
Kent D. Choquette,
K. L. Lear,
R. P. Schneider,
K. M. Geib,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 66,
issue 25
页码: 3413-3415
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.113371
出版商: AIP
数据来源: AIP
摘要:
We show that a buried oxide layer forming a current aperture in an all epitaxial vertical‐cavity surface emitting laser has a profound influence on the optical and electrical characteristics of the device. The lateral index variation formed around the oxide current aperture leads to a shift in the cavity resonance wavelength. The resonance wavelength under the oxide layer can thus be manipulated, independent of the as‐grown cavity resonance, by adjusting the oxide layer thickness and its placement relative to the active region. In addition, the electrical confinement afforded by the oxide layer enables record low threshold current densities and threshold voltages in these lasers. ©1995 American Institute of Physics.
点击下载:
PDF
(57KB)
返 回