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Cavity characteristics of selectively oxidized vertical‐cavity lasers

 

作者: Kent D. Choquette,   K. L. Lear,   R. P. Schneider,   K. M. Geib,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 66, issue 25  

页码: 3413-3415

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.113371

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We show that a buried oxide layer forming a current aperture in an all epitaxial vertical‐cavity surface emitting laser has a profound influence on the optical and electrical characteristics of the device. The lateral index variation formed around the oxide current aperture leads to a shift in the cavity resonance wavelength. The resonance wavelength under the oxide layer can thus be manipulated, independent of the as‐grown cavity resonance, by adjusting the oxide layer thickness and its placement relative to the active region. In addition, the electrical confinement afforded by the oxide layer enables record low threshold current densities and threshold voltages in these lasers. ©1995 American Institute of Physics.

 

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