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High precision depth profiling of light isotopes in low‐atomic‐mass solids

 

作者: G. Ross,   B. Terreault,  

 

期刊: Journal of Applied Physics  (AIP Available online 1980)
卷期: Volume 51, issue 2  

页码: 1259-1261

 

ISSN:0021-8979

 

年代: 1980

 

DOI:10.1063/1.327703

 

出版商: AIP

 

数据来源: AIP

 

摘要:

An elastic recoil detection technique has been developed to depth profile light isotopes (A≲35) in low‐atomic‐mass solids (A≲16). It utilizes the maximum‐scattering‐angle property rather than an absorber to reduce background, with resultant depth precision of about ±2 &mgr;g/cm2(100 A˚). The sensitivity is ?5×1016atoms/cm2for isotopes lighter than the substrate and ?1015atoms/cm2for heavier ones.

 

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