High precision depth profiling of light isotopes in low‐atomic‐mass solids
作者:
G. Ross,
B. Terreault,
期刊:
Journal of Applied Physics
(AIP Available online 1980)
卷期:
Volume 51,
issue 2
页码: 1259-1261
ISSN:0021-8979
年代: 1980
DOI:10.1063/1.327703
出版商: AIP
数据来源: AIP
摘要:
An elastic recoil detection technique has been developed to depth profile light isotopes (A≲35) in low‐atomic‐mass solids (A≲16). It utilizes the maximum‐scattering‐angle property rather than an absorber to reduce background, with resultant depth precision of about ±2 &mgr;g/cm2(100 A˚). The sensitivity is ?5×1016atoms/cm2for isotopes lighter than the substrate and ?1015atoms/cm2for heavier ones.
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