On the possibility of application of x‐ray diffraction edge contrast for the quantitative determination of high‐energy heavy ion range in silicon

 

作者: J. Auleytner,   J. Bak‐Misiuk,   Z. Furmanik,   J. Morawiec,  

 

期刊: Crystal Research and Technology  （WILEY Available online 1988）
卷期: Volume 23, issue 1  

页码: 20-24

 

ISSN:0232-1300

 

年代: 1988

 

DOI:10.1002/crat.2170230124

 

出版商: WILEY‐VCH Verlag

 

数据来源: WILEY

 

 

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