We present a detailed study of selective reflection from free-standing films of chiral smectic phases. Free-standing films are drawn of the chiral compound 2-(4-hexyloxyphenyl)-5-[4-(1-chloro-3-methylbutanoyloxy)phenyl]pyrimidine (2f-6) possessing a chiral smectic C and the recently discovered chiral smectic M phase, both phases showing the phenomenon of selective reflection of visible light in a certain temperature range. With linearly polarized incident light two selective reflection maxima are observed which are caused by the presence of π-walls in the film. The wavelength of the selective reflection maxima is independent of the film thickness, whereas the intensity decreases with decreasing film thickness. The dependence of the reflection maxima on temperature and enantiomeric excess is studied.