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Index of Refraction of Tantalum Oxide in the Wavelength Interval 2750-14000 Å

 

作者: J.M. Albella,   J.M. Martínez-Duart,   F. Rueda,  

 

期刊: Optica Acta: International Journal of Optics  （Taylor Available online 1975）
卷期: Volume 22, issue 12  

页码: 973-979

 

ISSN:0030-3909

 

年代: 1975

 

DOI:10.1080/713818999

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

The dispersion curve for the index of refraction of anodically formed Ta2O5thin films has been obtained from the interference minima of the reflection spectrum in the region 2750-14000 Å. The dependence on the wavelength may be expressed asnλ= 1·85 + 1671/(λ−903). The change of phase which takes place upon reflection is also obtained.

 

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