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Introduction to Studies of Aluminum and its Compounds by XPS

 

作者: Peter M. A. Sherwood,  

 

期刊: Surface Science Spectra  (AIP Available online 1998)
卷期: Volume 5, issue 1  

页码: 1-3

 

ISSN:1055-5269

 

年代: 1998

 

DOI:10.1116/1.1247880

 

出版商: American Vacuum Society

 

关键词: aluminum;XPS;valence band;aluminum compounds

 

数据来源: AIP

 

摘要:

Aluminum is a very important element because of its many practical applications, and XPS provides an attractive method for the investigation of, and distinguishing between, aluminum and its compounds. The Al2pcore XPS spectra shows a substantial shift (about 2 eV) between the metal peak and compound peaks, and the metal peak width is much less than the width of the compound peaks. This fact has been used in numerous studies where the Al2pspectrum can be easily curve fitted to identify a percentage area due to the metal and due to aluminum compounds. Several measurements of this kind, representing aluminum metal and 11 of its compounds, have been collected in a special issue ofSurface Science Spectra. This Introduction summarizes the data to be presented and provides an overview of the use of and interpretation of XPS studies of aluminum and its compounds.

 

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