首页   按字顺浏览 期刊浏览 卷期浏览 Comment on ‘‘ClockwiseC‐Vhysteresis phenomena of metal–tantalu...
Comment on ‘‘ClockwiseC‐Vhysteresis phenomena of metal–tantalum‐oxide–silicon‐oxide–silicon (P) capacitors due to leakage current through tantalum oxide’’ [J. Appl. Phys. 62, 4277 (1987)]

 

作者: J. A. Voorthuyzen,  

 

期刊: Journal of Applied Physics  （AIP Available online 1988）
卷期: Volume 64, issue 5  

页码: 2811-2812

 

ISSN:0021-8979

 

年代: 1988

 

DOI:10.1063/1.341588

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Questions are raised concerning the ac conductance measured by J.‐G. Hwuetal. [J. Appl. Phys.62, 4277 (1987)] and its lack of frequency dependence.

 

点击下载:  PDF (208KB)



返 回