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X‐ray spectral line coincidences between fluorineK‐ and transition‐metalL‐series lines

 

作者: P. G. Burkhalter,   G. Charatis,   P. D. Rockett,  

 

期刊: Journal of Applied Physics  (AIP Available online 1983)
卷期: Volume 54, issue 11  

页码: 6138-6149

 

ISSN:0021-8979

 

年代: 1983

 

DOI:10.1063/1.331949

 

出版商: AIP

 

数据来源: AIP

 

摘要:

X‐ray spectroscopy was performed in the 12–15‐A˚ region, recordingL‐series lines from selected laser‐irradiated transition metals. Line coincidences and near coincidences were identified between Cr, Mn, Fe, and NiLspectra, and F viiiand F ixK‐shell lines. Wavelengths were determined to accuracies of 1–3 mA˚ and will be utilized in selecting potential pumping candidates in future x‐ray lasing schemes. High‐resolution x‐ray spectra were collected under controlled illumination and target conditions, using 1.05‐ and 0.527‐&mgr;m laser excitation with the KMS CHROMA laser. Laser intensity varied from 1.2–2.5×1014W/cm2in 200‐ps pulses. Three groups of x‐ray spectra were collected with highly dispersive x‐ray crystals at wave bands centered at 12.643, 13.781, and 14.458 A˚, corresponding to H‐ and He‐like lines from fluorine. Two specially designed flat crystal spectrographs employing camera shutters were used with pairs of beryl and thallium acid phthalate (TAP) crystals. The spectra from potential lasant and pump candidates could be recorded on the same spectrogram to aid in identifying x‐ray line coincidences. In cases where wavelengths were measured in both the 1.05‐ and 0.527‐&mgr;m laser work, agreement within 1–3 mA˚ was obtained for theL‐series x‐ray lines. Within this accuracy range, some fiveL‐series x‐ray lines, mostly 2p‐3dtransitions from the metals Cr, Mn, and Ni, had wavelength values coincident withK‐series lines in fluorine.

 

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