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The penetration depth of 0.5–3‐keV electrons in solid hydrogen and deuterium

 

作者: J. Schou,   H. So&slash;rensen,  

 

期刊: Journal of Applied Physics  (AIP Available online 1978)
卷期: Volume 49, issue 2  

页码: 816-821

 

ISSN:0021-8979

 

年代: 1978

 

DOI:10.1063/1.324609

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The mirror‐substrate method was used for measuring the penetration depth of 0.5–3‐keV electrons in solid hydrogen and deuterium. The penetration depth was found to be 0.53×1018E1.72molecules/cm2with the energy given in keV. There was satisfactory agreement with other data. The measurements also showed that the escape depth for true secondary electrons from solid deuterium is less than 50 A˚, which agrees well with the small values for the secondary‐electron‐emission coefficient found for solid deuterium. Results were furthermore obtained for the electron‐reflection coefficient for the gold substrate, i.e., the number of electrons that are reflected with high energies. The electron‐reflection coefficient agrees well with other results, both with respect to magnitude and energy dependence.

 

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