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Characterization of Ba0.5Sr0.5TiO3thin film capacitors produced by pulsed laser deposition

 

作者: Q.X. Jia,   D.S. Zhou,   X.D. Wu,   S.R. Foltyn,   P. Tiwari,   T.E. Mitchell,  

 

期刊: Integrated Ferroelectrics  (Taylor Available online 1995)
卷期: Volume 10, issue 1-4  

页码: 73-79

 

ISSN:1058-4587

 

年代: 1995

 

DOI:10.1080/10584589508012265

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

High crystallinity Ba0.5Sr0.5TiO3thin films were deposited on LaAlO3substrates by pulsed laser deposition. A conductive metallic oxide, SrRuO3, provided not only a good bottom electrode for Ba0.5Sr0.5TiO3but also an excellent seed layer for epitaxial growth of Ba0.5Sr0.5TiO3on it. The epitaxial nature of the Ba0.5Sr0.5TiO3thin films on the LaAlO3substrate was confirmed by x-ray diffraction, Rutherford backscattering spectroscopy, and cross-sectional transmission electron microscopy. The quite good dielectric and electrical properties of crystalline Ba0.5Sr0.5TiO3thin films suggest that Ba0.5Sr0.5TiO3/SrRuO3is a good combination in terms of structural, electrical, and dielectric properties of Ba0.5Sr0.5TiO3thin films.

 

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