Characterization of Ba0.5Sr0.5TiO3thin film capacitors produced by pulsed laser deposition
作者:
Q.X. Jia,
D.S. Zhou,
X.D. Wu,
S.R. Foltyn,
P. Tiwari,
T.E. Mitchell,
期刊:
Integrated Ferroelectrics
(Taylor Available online 1995)
卷期:
Volume 10,
issue 1-4
页码: 73-79
ISSN:1058-4587
年代: 1995
DOI:10.1080/10584589508012265
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
High crystallinity Ba0.5Sr0.5TiO3thin films were deposited on LaAlO3substrates by pulsed laser deposition. A conductive metallic oxide, SrRuO3, provided not only a good bottom electrode for Ba0.5Sr0.5TiO3but also an excellent seed layer for epitaxial growth of Ba0.5Sr0.5TiO3on it. The epitaxial nature of the Ba0.5Sr0.5TiO3thin films on the LaAlO3substrate was confirmed by x-ray diffraction, Rutherford backscattering spectroscopy, and cross-sectional transmission electron microscopy. The quite good dielectric and electrical properties of crystalline Ba0.5Sr0.5TiO3thin films suggest that Ba0.5Sr0.5TiO3/SrRuO3is a good combination in terms of structural, electrical, and dielectric properties of Ba0.5Sr0.5TiO3thin films.
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