Metalorganic molecular beam epitaxy of InP, Ga0.47In0.53As, and GaAs with tertiarybutylarsine and tertiarybutylphosphine
作者:
D. Ritter,
M. B. Panish,
R. A. Hamm,
D. Gershoni,
I. Brener,
期刊:
Applied Physics Letters
(AIP Available online 1990)
卷期:
Volume 56,
issue 15
页码: 1448-1450
ISSN:0003-6951
年代: 1990
DOI:10.1063/1.102494
出版商: AIP
数据来源: AIP
摘要:
Thermally cracked tertiarybutylarsine and tertiarybutylphosphine were used to replace AsH3and PH3for the growth of Ga0.47In0.53As and InP by metalorganic molecular beam epitaxy. For both materials, carrier concentrationsn=(1–2)×1015cm−3were obtained at 300 and 77 K, with 77 K mobilities of 29 000 and 31 000 cm2 V−1 s−1. The GaAs wasp‐type withp=4×1015cm−3at both temperatures and a 77 K mobility of 2200 cm2 V−1 s−1. The lifetimes for carriers in 14–60 A˚ thick quantum wells were 3±1 ns. The reacting arsenic species for epitaxy were As2and As4. The reacting phosphorus species were PH2and possibly PH.
点击下载:
PDF
(312KB)
返 回