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Reliability problems in state‐of‐the‐art GaAs devices and circuits

 

作者: A. Christou,  

 

期刊: Quality and Reliability Engineering International  （WILEY Available online 1989）
卷期: Volume 5, issue 1  

页码: 37-46

 

ISSN:0748-8017

 

年代: 1989

 

DOI:10.1002/qre.4680050109

 

出版商: Wiley Subscription Services, Inc., A Wiley Company

 

关键词: Reliability;Electromigration;Microwaves;Gallium arsenide;Transistors

 

数据来源: WILEY

 

摘要:

AbstractA review of the reliability status of GaAs discrete devices and integrated circuits is given. In the present survey of new devices and circuits it is shown that a significant number of reliability problems continue to persist.

 

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