Formation of elemental Ag precipitates in AlGaAs by ion implantation and thermal annealing
作者:
J. C. P. Chang,
J. Ye,
M. R. Melloch,
D. T. Crouse,
D. D. Nolte,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 71,
issue 24
页码: 3501-3503
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.120372
出版商: AIP
数据来源: AIP
摘要:
We report transmission electron microscopy (TEM) studies of precipitation in Ag-implanted and annealedAl0.3Ga0.7As.Silver was chosen because it does not form compounds with Ga and/or As when precipitating based on bulk thermodynamics arguments. TEM confirmed the formation of an elemental metal/semiconductor composite, which consists of nanometer-sized Ag (fcc structure) precipitates dispersed in the matrix. The precipitates are nonspherical and have an orientation relationship toAl0.3Ga0.7Asof (200)Ag//(200)AlGaAs, (02-2)Ag//(02-2)AlGaAs, and [011]Ag//[011]AlGaAs. High temperature (900 °C) anneals transform the phase of the precipitate to hexagonal,Ag3(GaAl)compounds. This shape distribution has been correlated with inhomogeneous broadening of the optical absorption. ©1997 American Institute of Physics.
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