Correlation of x‐ray photoelectron spectroscopy and Rutherford backscattering spectroscopy depth profiles on Hg1−xCdxTe native oxides
作者:
G. H. Winton,
L. Faraone,
R. Lamb,
期刊:
Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films
(AIP Available online 1994)
卷期:
Volume 12,
issue 1
页码: 35-43
ISSN:0734-2101
年代: 1994
DOI:10.1116/1.578901
出版商: American Vacuum Society
关键词: TERNARY COMPOUNDS;MERCURY TELLURIDES;CADMIUM TELLURIDES;CADMIUM TELLURIDES;OXIDATION;DEPTH PROFILES;PHOTOELECTRON SPECTROSCOPY;RBS;MEASURING METHODS;CORRELATIONS;DATA ANALYSIS;PHOTOCHEMICAL REACTIONS
数据来源: AIP
摘要:
The composition of photochemical native oxides grown on Hg1−xCdxTe (x=0.3) has been studied using x‐ray photoelectron spectroscopy (XPS) and Rutherford backscattering spectroscopy (RBS). By analyzing and comparing the results of the XPS and RBS depth profiles, a simple method of multiplying the XPS raw counts has enabled a realistic XPS depth profile to be obtained without having to directly account for sensitivity factors or preferential sputtering of elements. Photochemical oxides grown in O2ambients were found to have a Hg rich surface layer in addition to a higher Hg concentration throughout the oxide film when compared to layers grown in an N2O ambient. For both growth processes, the bulk oxide regions had Cd/Te ratios in excess of that for the underlying mercury cadmium telluride (MCT) substrate and concomitantly lower Hg/Te ratios. Comparisons with other work indicate that the photochemically grown oxides are quite similar to anodically grown oxides in terms of oxide /MCT interface widths and oxide compositions.
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