Improved atomic force microscopy resolution using an electric double layer
作者:
I. Yu. Sokolov,
G. S. Henderson,
F. J. Wicks,
G. A. Ozin,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 70,
issue 7
页码: 844-846
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.118221
出版商: AIP
数据来源: AIP
摘要:
High resolution (“atomic”) images of clinochlore and muscovite have been obtained in aqueous solution by inducing an electric double layer between the atomic force microscope tip and the sample surface. The electric double layer is created by the addition of a surfactant to water and greatly improves image resolution. A theoretical model is proposed to explain the improved resolution. ©1997 American Institute of Physics.
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