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Improved atomic force microscopy resolution using an electric double layer

 

作者: I. Yu. Sokolov,   G. S. Henderson,   F. J. Wicks,   G. A. Ozin,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 70, issue 7  

页码: 844-846

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.118221

 

出版商: AIP

 

数据来源: AIP

 

摘要:

High resolution (“atomic”) images of clinochlore and muscovite have been obtained in aqueous solution by inducing an electric double layer between the atomic force microscope tip and the sample surface. The electric double layer is created by the addition of a surfactant to water and greatly improves image resolution. A theoretical model is proposed to explain the improved resolution. ©1997 American Institute of Physics.

 

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