The authors extend their study of the effect of macroscopic impurities on resistive and Hall measurements to include objects of finite thickness. The effect of such impurities is calculated for a series of rectangular parallelepipeds with two current and two voltage contacts on the corners of one square face. The weighting functions display singularities near these contacts, but these are shown to vanish in the two-dimensional limit, in agreement with previous results. Finally, it is shown that while Hall measurements principally sample the plane of the electrodes, resistivity measurements sample more of the interior of an object of finite thickness. ©1998 American Institute of Physics.