Reliability of aluminum‐free 808 nm high‐power laser diodes with uncoated mirrors
作者:
I. Eliashevich,
J. Diaz,
H. Yi,
L. Wang,
M. Razeghi,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 66,
issue 23
页码: 3087-3089
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.113404
出版商: AIP
数据来源: AIP
摘要:
The reliability of uncoated InGaAsP/GaAs high‐power diode lasers emitting at 808 nm wavelength has been studied. 47 W of quasicontinuous wave output power (pulse width 200 &mgr;s, frequency 20 Hz) have been obtained from a 1‐cm‐wide laser bar. A single‐stripe diode without mirror coating has been life tested at 40 °C for emitting power of 800 mW continuous wave (cw) and showed no noticeable degradation and no change of the lasing wavelength after 6000 h of operation. ©1995 American Institute of Physics.
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