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Reliability of aluminum‐free 808 nm high‐power laser diodes with uncoated mirrors

 

作者: I. Eliashevich,   J. Diaz,   H. Yi,   L. Wang,   M. Razeghi,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 66, issue 23  

页码: 3087-3089

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.113404

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The reliability of uncoated InGaAsP/GaAs high‐power diode lasers emitting at 808 nm wavelength has been studied. 47 W of quasicontinuous wave output power (pulse width 200 &mgr;s, frequency 20 Hz) have been obtained from a 1‐cm‐wide laser bar. A single‐stripe diode without mirror coating has been life tested at 40 °C for emitting power of 800 mW continuous wave (cw) and showed no noticeable degradation and no change of the lasing wavelength after 6000 h of operation. ©1995 American Institute of Physics.

 

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