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Enhanced surface recombination in a‐Si:H solar cells caused by light stress

 

作者: W. Kusian,   H. Pfleiderer,  

 

期刊: AIP Conference Proceedings  (AIP Available online 1991)
卷期: Volume 234, issue 1  

页码: 290-297

 

ISSN:0094-243X

 

年代: 1991

 

DOI:10.1063/1.41039

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The change of the spectral photocurrent characteristics of amorphous silicon pin solar cells with light induced degradation is compared with the effect of slightly doping the ‘‘i‐layer’’. Both treatments yield similar results. Light stress lets the primary photocurrent, measured with blue light, decrease and the secondary photocurrent, measured with red light, increased. The similar change occurs when a slight n‐doping of the ‘‘i‐layer’’ is replaced by a slight p‐doping. A simple interpretation in terms of unfirom fields and preponderant surface recombination is possible and will be outlined.We additionally resort to numerical similations. Degradation is to be simulated by the introduction of stronger recombination. The crombination rate will be distributed in space. We indeed find that enhanced surface recombination plays the key role in guiding the simulation towards our experiment.

 

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