A Positive‐Replica Technique for Electron Microscopy
作者:
C. M. Schwartz,
A. E. Austin,
P. M. Weber,
期刊:
Journal of Applied Physics
(AIP Available online 1949)
卷期:
Volume 20,
issue 2
页码: 202-205
ISSN:0021-8979
年代: 1949
DOI:10.1063/1.1698333
出版商: AIP
数据来源: AIP
摘要:
A positive‐replica technique for electron microscopy has been developed, which reproduces the contour variations of the specimen surface, and permits direct visual interpretation of elevation. The method utilizes two resins, each mutually insoluble in the solvent for the other, specifically, polyvinyl alcohol plus Formvar. Shadow casting of the Formvar positive replica enhances detail and highlights the areas in relief in the original surface. Examples are given, in particular, applied to wear‐test specimens.
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