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A Positive‐Replica Technique for Electron Microscopy

 

作者: C. M. Schwartz,   A. E. Austin,   P. M. Weber,  

 

期刊: Journal of Applied Physics  (AIP Available online 1949)
卷期: Volume 20, issue 2  

页码: 202-205

 

ISSN:0021-8979

 

年代: 1949

 

DOI:10.1063/1.1698333

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A positive‐replica technique for electron microscopy has been developed, which reproduces the contour variations of the specimen surface, and permits direct visual interpretation of elevation. The method utilizes two resins, each mutually insoluble in the solvent for the other, specifically, polyvinyl alcohol plus Formvar. Shadow casting of the Formvar positive replica enhances detail and highlights the areas in relief in the original surface. Examples are given, in particular, applied to wear‐test specimens.

 

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