A New Scanning Probe Microscopy For Imaging Subsurface Interface Structure
作者:
W. J. Kaiser,
L. D. Bell,
M. H. Hecht,
L. C. Davis,
期刊:
AIP Conference Proceedings
(AIP Available online 1991)
卷期:
Volume 241,
issue 1
页码: 302-313
ISSN:0094-243X
年代: 1991
DOI:10.1063/1.41424
出版商: AIP
数据来源: AIP
摘要:
A new scanning probe microscopy has been developed which directly measures carrier scattering in materials and at interfaces. This energy‐resolved spectroscopy of carrier‐carrier scattering is applicable to both electron and hole scattering in bulk materials and in complex structures. This paper describes the unique experimental technique and reviews a fundamental theoretical treatment which is in excellent agreement with the experimental results.
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