AbstractIterative numerical analysis methods, similar to those used for ray tracing in electron and ion guns, have been employed to calculate the electrical potential distribution in the vicinity of the orifice of an electrical sensing zone (esz) instrument. In particular, the electrical potential across the mouth of the orifice is considered and the effects of numerically bevelling the sharp peripheral edge are demonstrated.The results support the empirical equation:\documentclass{article}\pagestyle{empty}\begin{document}$$ {\rm d}\phi {\rm /d}x \sim 1 + \alpha '\{(r/R)/(1 - r/R)\} ^{\beta '} $$\end{document}for the axial component of the potential gradient, dϕ/dx, at the mouth of the orifice expressed as a function of the radial distance,r, from the centre of the orifice of radiusR; α′ and β′ are empirical constants. This equation was derived from previously reported experimental data on relative shifts and heights of artefact peaks apparent on the coarse side of size distributions measured via the esz method on a series of latex copo