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Nature of Bombardment Damage and Energy Levels in Semiconductors

 

作者: J. H. Crawford,   J. W. Cleland,  

 

期刊: Journal of Applied Physics  (AIP Available online 1959)
卷期: Volume 30, issue 8  

页码: 1204-1213

 

ISSN:0021-8979

 

年代: 1959

 

DOI:10.1063/1.1735294

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The different effects of Co60gamma ray and fast neutron bombardment on the electrical behavior of germanium are discussed in terms of different local distributions of lattice defects expected for these two types of radiation. For the first of these, which is expected to introduce randomly distributed pairs of interstitials and vacancies, the state at 0.20 ev below the conduction band has been found to increase the concentration of ionized scattering centers on becoming occupied with conduction electrons. This state has been ascribed to a mobile interstitial because of its annealing behavior at moderate temperatures. Energy levels inp‐type Ge and their annealing behavior are also discussed. In neutron irradiatedn‐type germanium the behavior of Hall mobility and the apparent energy distribution of defect levels are discussed in terms of a tentative model for the potential distribution around regions of high local lattice disorder expected to result from neutron bombardment. This model postulates that the disordered region isptype and is surrounded by a positive space charge region in then‐type matrix which insulates it from the matrix. This configuration of electrostatic potential around the disordered region in effect produces an insulating region whose radius is ∼10 times that of the disordered region itself. The behavior of Hall mobility in irradiatedn‐type specimens is consistent with the predictions of this model.

 

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