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Xeroradiographic Properties of Amorphous Selenium

 

作者: John L. Donovan,  

 

期刊: Journal of Applied Physics  (AIP Available online 1970)
卷期: Volume 41, issue 5  

页码: 2109-2114

 

ISSN:0021-8979

 

年代: 1970

 

DOI:10.1063/1.1659173

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The xeroradiographic properties of selenium have been investigated using a typical medical x‐ray spectrum. The influence of applied field was found to be very important in determining the surface potential discharge rate for both positively and negatively charged selenium. The x‐ray energy absorbed per surface charge neutralized varied from 39 to 2.2 eV as the applied field increased from 104to 2.4×105V/cm. No effect of thickness on the discharge properties of evaporated selenium layers up to 530‐&mgr;m thick was observed.

 

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