Thin films of incompatible polymer blends can form a variety of structures on preparation. For the polymer blend system consisting of two poly(styrene-co-para-bromo-styrene)s at different degrees of bromination, PBrxS/PBryS, the compatibility can be tuned through a variation of the difference in the degree of bromination. Within this blend system, two series of samples with different compatibilities were investigated at various blend compositions. The surface morphology of the thin films was investigated by atomic force microscopy (AFM) measurements, while diffuse X-ray scattering provided additional depth sensitivity at a comparable lateral resolution. The results are indicative for phase separation lateral, as well as perpendicular, to the sample surface.