Micro-electroreflectance and photoreflectance characterization of the bias dependence of the quantum confined Stark effect in a fabricated 0.98 &mgr;m InGaAs/GaAs/InGaP laser
作者:
Lionel Aigouy,
Fred H. Pollak,
Godfrey Gumbs,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 70,
issue 19
页码: 2562-2564
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.118919
出版商: AIP
数据来源: AIP
摘要:
Using electro- and photoreflectance with a spatial resolution of≈10 &mgr;mwe have evaluated the energy of the fundamental conduction to heavy-hole (1C–1HH) quantum transition of a fabricated 0.98 &mgr;m InGaAs/GaAs/InGaPp-i-nquantum well laser structure as a function of bias and position on the laser stripe. From a comparison of the measured forward/reverse bias dependence of the1C–1HH energy with a theoretical calculation of the quantum confined Stark effect, we have been able to evaluate the built-in electric field and width of the insulating region. ©1997 American Institute of Physics.
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