Failure phenomena and mechanisms of polymeric light‐emitting diodes: Indium–tin–oxide damage
作者:
Ching‐Ian Chao,
Kuen‐Ru Chuang,
Show‐An Chen,
期刊:
Applied Physics Letters
(AIP Available online 1996)
卷期:
Volume 69,
issue 19
页码: 2894-2896
ISSN:0003-6951
年代: 1996
DOI:10.1063/1.117354
出版商: AIP
数据来源: AIP
摘要:
Indium–tin–oxide (ITO) coated on a glass plate as the transparent electrode in polymeric light‐emitting diodes (LEDs) generates some volcano‐like patterns during use especially at a higher applied electric field strength. Such an ITO damage phenomenon is independent of Joule heat, conjugation structure of the polymer, and light‐emission process, but only dependent on the applied electric field strength. The ITO damage, which results from a self‐decomposition reaction, can cause a reduction of lifetime of the device. ©1996 American Institute of Physics.
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