Imaging Poly (1‐Butene) Films by SFM/STM
作者:
L. M. Eng,
H. Fuchs,
K. D. Jandt,
J. Petermann,
期刊:
AIP Conference Proceedings
(AIP Available online 1991)
卷期:
Volume 241,
issue 1
页码: 262-268
ISSN:0094-243X
年代: 1991
DOI:10.1063/1.41420
出版商: AIP
数据来源: AIP
摘要:
Thin poly(1‐butene) (PB‐1) films drawn from the melt were deposited onto substrates of highly oriented pyrolytic graphite (HOPG) for an investigation with scanning force (SFM) and scanning tunneling microscopy (STM). The aim of this investigation was to study the surface electronic and topographic structure of these ultradrawn polymer films, which strongly influence the interfacial properties in contact with other materials, as for example in composite materials. Our SFM measurements excellently complement previous transmission electron microscopic (TEM) investigations showing the filamentary structure of the uniaxially stretched polymer as well as details within PB‐1 film defect structures (i.e., cracks). Close to monomolecular areas of the PB‐1 film, high resolution STM imaging simultaneously reveals the atomically resolved HOPG substrate surface as well as a helical structure originating from the polymer film.
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