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Measurements of the optical properties of liquid silicon and germanium using nanosecond time‐resolved ellipsometry

 

作者: G. E. Jellison,   D. H. Lowndes,  

 

期刊: Applied Physics Letters  (AIP Available online 1987)
卷期: Volume 51, issue 5  

页码: 352-354

 

ISSN:0003-6951

 

年代: 1987

 

DOI:10.1063/1.98438

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The optical properties of liquid silicon and germanium have been determined at several laser wavelengths from 1.96 to 3.71 eV, using time‐resolved ellipsometric measurements during pulsed laser melting. The results from these transient melting experiments are compared with results from the literature for materials held above their melting temperatures for long periods of time. The results for liquid germanium agree well with those of J. N. Hodgson [Philos. Mag.6, 509 (1961)], but the results for liquid silicon disagree with the results of K. M. Shvarev, B. A. Baum, and P. V. Gel’d [High Temp.15, 548 (1977)].

 

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