Recoil implantation of radioactive transition metals and their investigation in silicon by deep‐level transient spectroscopy
作者:
N. Achtziger,
H. Gottschalk,
T. Licht,
J. Meier,
M. Ru¨b,
U. Reislo¨hner,
W. Witthuhn,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 66,
issue 18
页码: 2370-2372
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.113986
出版商: AIP
数据来源: AIP
摘要:
Radioactive isotopes are produced by nuclear reactions in a thin target foil. The recoiling products are directly implanted into samples mounted off‐axis to the primary beam. Using proton or &agr; beams and appropriate target foils, radioactive isotopes of Ti, V, Cr, Mn, and Co were implanted. The implantation parameters are presented and compared with other implantation techniques for radioactive isotopes. To demonstrate an application, a deep‐level transient spectroscopy measurement on48V in silicon is presented. Ti and V correlated band‐gap levels were observed during the48V decay. ©1995 American Institute of Physics.
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