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Recoil implantation of radioactive transition metals and their investigation in silicon by deep‐level transient spectroscopy

 

作者: N. Achtziger,   H. Gottschalk,   T. Licht,   J. Meier,   M. Ru¨b,   U. Reislo¨hner,   W. Witthuhn,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 66, issue 18  

页码: 2370-2372

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.113986

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Radioactive isotopes are produced by nuclear reactions in a thin target foil. The recoiling products are directly implanted into samples mounted off‐axis to the primary beam. Using proton or &agr; beams and appropriate target foils, radioactive isotopes of Ti, V, Cr, Mn, and Co were implanted. The implantation parameters are presented and compared with other implantation techniques for radioactive isotopes. To demonstrate an application, a deep‐level transient spectroscopy measurement on48V in silicon is presented. Ti and V correlated band‐gap levels were observed during the48V decay. ©1995 American Institute of Physics.

 

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