首页   按字顺浏览 期刊浏览 卷期浏览 Morphology of Epitaxial Growth of GaAs by a Molecular Beam Method: The Observation of S...
Morphology of Epitaxial Growth of GaAs by a Molecular Beam Method: The Observation of Surface Structures

 

作者: A. Y. Cho,  

 

期刊: Journal of Applied Physics  (AIP Available online 1970)
卷期: Volume 41, issue 7  

页码: 2780-2786

 

ISSN:0021-8979

 

年代: 1970

 

DOI:10.1063/1.1659315

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Homoepitaxial growth of GaAs was studiedin situin an ultrahigh‐vacuum high‐energy electron diffraction (HEED) system. Two surface structures,GaAs(1¯1¯1¯)−(19)1/2andGaAs(1¯1¯1¯)−2, were observed during growth. The transition from one surface structure to the other was found to be a function of the deposition rate and the substrate temperature, with the high‐temperature structure being the(1¯1¯1¯)−(19)1/2. The film growth morphology was studied by the carbon replication technique. Growth by a step mechanism was observed on a bromine‐methanol etched surface while three‐dimensional nuclei were observed on a polished or contaminated surface.

 

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