Hardware for digitally controlled scanned probe microscopes
作者:
S. M. Clark,
D. R. Baselt,
C. F. Spence,
M. G. Youngquist,
J. D. Baldeschwieler,
期刊:
Review of Scientific Instruments
(AIP Available online 1992)
卷期:
Volume 63,
issue 10
页码: 4296-4307
ISSN:0034-6748
年代: 1992
DOI:10.1063/1.1143728
出版商: AIP
数据来源: AIP
摘要:
The design and implementation of a flexible and modular digital control and data acquisition system for scanned probe microscopes (SPMs) is presented. The measured performance of the system shows it to be capable of 14‐bit data acquisition at a 100‐kHz rate and a full 18‐bit output resolution resulting in less than 0.02‐A˚ rms position noise while maintaining a scan range in excess of 1 &mgr;m in both theXandYdimensions. This level of performance achieves the goal of making the noise of the microscope control system an insignificant factor for most experiments. The adaptation of the system to various types of SPM experiments is discussed. Advances in audio electronics and digital signal processors have made the construction of such high performance systems possible at low cost.
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