Influence of growth interruption on inverted interface quality in single AlAs‐GaAs quantum wells grown by molecular beam epitaxy
作者:
J. Zhang,
P. Dawson,
J. H. Neave,
K. J. Hugill,
I. Galbraith,
P. N. Fawcett,
B. A. Joyce,
期刊:
Journal of Applied Physics
(AIP Available online 1990)
卷期:
Volume 68,
issue 11
页码: 5595-5600
ISSN:0021-8979
年代: 1990
DOI:10.1063/1.346970
出版商: AIP
数据来源: AIP
摘要:
Three techniques have been combined to correlate interface morphology and optical properties of single AlAs‐GaAs quantum wells grown by molecular beam epitaxy (MBE) with and without growth interruption at the inverted (GaAs on AlAs) interface. Surface recovery and interface formation were monitoredinsituby reflection high energy electron diffraction, optical properties were assessed by photoluminescence excitation (PLE) spectroscopy and the results compared with a Monte Carlo simulation of MBE growth, extended to evaluate PLE linewidths. Criteria for linewidth reduction have been established and interface morphology described.
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