Surface roughening and columnar growth of thin amorphous CuTi films
作者:
U. Geyer,
U. von Hu¨lsen,
P. Thiyagarajan,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 70,
issue 13
页码: 1691-1693
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.118671
出版商: AIP
数据来源: AIP
摘要:
Different growth stages and the microstructure of amorphous CuTi films are investigated by scanning tunneling microscopy and small angle neutron scattering. During film growth at room temperature, the initially smooth films show increasing surface roughening and finally a change to a columnar growth mode with column diameters of about 20 nm. The interfacial energies associated with the column boundaries are higher than those of grain boundaries in crystalline systems. The column boundaries might be the origin of high intrinsic tensile stresses measured before in the amorphous CuTi films. ©1997 American Institute of Physics.
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