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Near‐Field Optical Microscopy and Optical Tunneling Detection

 

作者: D. Courjon,   M. Spajer,   A. Jalocha,   S. Leblanc,  

 

期刊: AIP Conference Proceedings  (AIP Available online 1991)
卷期: Volume 241, issue 1  

页码: 70-78

 

ISSN:0094-243X

 

年代: 1991

 

DOI:10.1063/1.41405

 

出版商: AIP

 

数据来源: AIP

 

摘要:

By exploring the surface of an illuminated object at a very short distance by means of a subwavelength detector, it is possible to reconstruct images whose resolution is beyond the diffraction limit. This opportunity due to near field properties can be explained in terms of non radiative field detection that is of optical tunneling effect. We present some recent results obtained by using two different illumination‐detection configurations. The first one using internal reflection allows to analyze the surface of transparent objects whereas the second one using the same tip as subwavelength emittor and detector is suitable for reflecting objects.

 

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