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Maximum Allowable Percent Defective (MAPD) Single Sampling Inspection by Attributes Plan

 

作者: SoundararajanV.,  

 

期刊: Journal of Quality Technology  （Taylor Available online 1975）
卷期: Volume 7, issue 4  

页码: 173-182

 

ISSN:0022-4065

 

年代: 1975

 

DOI:10.1080/00224065.1975.11980694

 

出版商: Taylor&Francis

 

关键词: Maximum Allowable Percent Defective;Single Sampling Attributes Plans

 

数据来源: Taylor

 

摘要:

In this paper, Single Sampling Attributes Plans indexed by Maximum Allowable Percent Defectives (MAPD) are given. A table, for transition from one set of parameters to match the Operating Characteristic Curve (OC curve) to other similar sets, is given.

 

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