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Field emission from surface states of silicon

 

作者: Qing-An Huang,   Ming Qin,   Bin Zhang,   Johnny K. O. Sin,  

 

期刊: Journal of Applied Physics  (AIP Available online 1997)
卷期: Volume 81, issue 11  

页码: 7589-7594

 

ISSN:0021-8979

 

年代: 1997

 

DOI:10.1063/1.365304

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Field emission from a single level surface state is modelled and numerically estimated. Field emission current from the surface state is dominant at low fields while field emission current from the conduction band is dominant at high fields due to not enough electrons being supplied for the surface state. The field emission Fowler–Nordheim plot shows no linearity. ©1997 American Institute of Physics.

 

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