Field emission from surface states of silicon
作者:
Qing-An Huang,
Ming Qin,
Bin Zhang,
Johnny K. O. Sin,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 81,
issue 11
页码: 7589-7594
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.365304
出版商: AIP
数据来源: AIP
摘要:
Field emission from a single level surface state is modelled and numerically estimated. Field emission current from the surface state is dominant at low fields while field emission current from the conduction band is dominant at high fields due to not enough electrons being supplied for the surface state. The field emission Fowler–Nordheim plot shows no linearity. ©1997 American Institute of Physics.
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