Secondary ion mass spectrometry study of oxygen accumulation at GaAs/AlGaAs interfaces grown by molecular beam epitaxy
作者:
T. Achtnich,
G. Burri,
M. A. Py,
M. Ilegems,
期刊:
Applied Physics Letters
(AIP Available online 1987)
卷期:
Volume 50,
issue 24
页码: 1730-1732
ISSN:0003-6951
年代: 1987
DOI:10.1063/1.97730
出版商: AIP
数据来源: AIP
摘要:
The accumulation of oxygen at GaAs/AlGaAs interfaces grown by molecular beam epitaxy has been established by secondary ion mass spectrometry profiling of GaAs/AlGaAs multilayer structures. An enhanced oxygen peak was observed at the boundary between GaAs and AlxGa1−xAs layers withx=0.35 andx=1 when the binary layer is deposited on top of the ternary layer. The segregation of oxygen may be a contributing factor responsible for the lower luminescence reported in the first GaAs well of multilayer quantum well structures and for the difference between normal and inverted interface high electron mobility devices.
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