Controlled manipulation of nanoparticles with an atomic force microscope
作者:
T. Junno,
K. Deppert,
L. Montelius,
L. Samuelson,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 66,
issue 26
页码: 3627-3629
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.113809
出版商: AIP
数据来源: AIP
摘要:
We report on the application of the atomic force microscope (AFM) to manipulate and position nanometer‐sized particles with nanometer precision. The technique, which can be regarded as a nanometer‐scale analogy to atomic level manipulation with the scanning tunneling microscope, allowed us to form arbitrary nanostructures, under ambient conditions, by controlled manipulation of individual 30 nm GaAs particles. A whole new set of nanodevices can be fabricated particle‐by‐particle for studies of quantum effects and single electron tunneling. We also demonstrate a method, based on the AFM manipulation, to determine the true lateral dimensions of nano‐objects, in spite of the tip‐sample convolution. ©1995 American Institute of Physics.
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