X‐ray photoelectron diffraction from the HgCdTe(111) surface
作者:
G. S. Herman,
D. J. Friedman,
T. T. Tran,
C. S. Fadley,
G. Granozzi,
G. A. Rizzi,
J. Osterwalder,
S. Bernardi,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1991)
卷期:
Volume 9,
issue 3
页码: 1870-1873
ISSN:1071-1023
年代: 1991
DOI:10.1116/1.585814
出版商: American Vacuum Society
关键词: (HgCd)Te
数据来源: AIP
摘要:
The surface polarity of a mercury cadmium telluride (MCT) (111) crystal surface has been determined by x‐ray photoelectron diffraction (XPD). Emission from the core levels of Hg, Cd, and Te gave reproducible photoelectron diffraction patterns with considerable fine structure. Comparisons between experiment and single scattering cluster calculations viaRfactors very well distinguished the different kinds of lattice sites of Cd, Hg, and Te, and also permitted unambiguously assigning a cationic termination to the sample studied. This is thus a demonstration of the capability of XPD to study the type of termination involved at MCT and other compound semiconductor surfaces.
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