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Estimation of light‐reflection‐layer thickness by optical second‐h...
Estimation of light‐reflection‐layer thickness by optical second‐harmonic generation and Raman scattering from semiconductor superlattices
The change in the refractive index at the surface of separation between two different media gives rise to the phenomena of reflection and refraction. Reflection requires that the boundary is not a geometrical surface but a thin transition layer. The depth of this layer was estimated by optical second‐harmonic generation and Raman scattering from the surface of a semiconductor superlattice. The function of the secondary electromagnetic waves excited in the medium was discussed.