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Applicability of the Fano plot to secondary electron (SE) yield data

 

作者: Mihir Parikh,   Ryuichi Shimizu,  

 

期刊: Applied Physics Letters  （AIP Available online 1976）
卷期: Volume 29, issue 8  

页码: 516-517

 

ISSN:0003-6951

 

年代: 1976

 

DOI:10.1063/1.89150

 

出版商: AIP

 

数据来源: AIP

 

摘要:

SE yield (&dgr;0) data can be interpreted in terms of the Fano plot, thereby yielding a simple formulation of &dgr;0with respect to the incident electron energyTand a correlation between the mean ionization potential ⟨I⟩ and a parameter in the Fano plot.

 

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