Limits of imaging resolution for atomic force microscopy of molecules
作者:
T. P. Weihs,
Z. Nawaz,
S. P. Jarvis,
J. B. Pethica,
期刊:
Applied Physics Letters
(AIP Available online 1991)
卷期:
Volume 59,
issue 27
页码: 3536-3538
ISSN:0003-6951
年代: 1991
DOI:10.1063/1.105649
出版商: AIP
数据来源: AIP
摘要:
The imaging resolution of an atomic force microscope operating in contact with a Langmuir–Blodgett (LB) film is predicted as a function of applied force, tip radius, adhesive force, and tip and film properties. The elastic modulus and the hardness of the LB film were measured using a nanoindenter and the imaging resolution is predicted using both a simple Hertzian elastic analysis and one that includes adhesive forces between the tip and the sample. For a small applied force (<1 nN) the resolution improves sharply as the tip radius and the adhesive force decrease. The onset of inelastic deformation, however, limits the resolution of the sharpest tips.
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