All‐in‐one spectrometer—A simple experimental setup for measuring transport characteristics in semiconductors
作者:
K. Oettinger,
B. K. Meyer,
期刊:
Review of Scientific Instruments
(AIP Available online 1995)
卷期:
Volume 66,
issue 10
页码: 4985-4988
ISSN:0034-6748
年代: 1995
DOI:10.1063/1.1146120
出版商: AIP
数据来源: AIP
摘要:
The characterization of semiconductor heterostructures requires different measurement techniques such as photoluminescence, Shubnikov–de Haas, and cyclotron resonance. We present a simple experimental setup which allows to make use of all these techniques without changing the equipment. There is no need for electrical contacts. The performance is demonstrated on InxGa1−xAs/InP quantum wells. ©1995 American Institute of Physics.
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