X‐ray topographic description of mode in a vibrating crystal
作者:
C. E. Wagner,
R. A. Young,
期刊:
Journal of Applied Crystallography
(WILEY Available online 1969)
卷期:
Volume 2,
issue 1
页码: 39-41
ISSN:1600-5767
年代: 1969
DOI:10.1107/S0021889869006467
出版商: International Union of Crystallography
数据来源: WILEY
摘要:
X‐ray diffraction topography can be used to describe ultrasonic vibrational modes in resonating crystals. Dependence of intensity enhancement on Bragg reflection and on the vibrational displacement parallel to the diffraction vector allows the determination of the polarization direction and positional details of the standing waves to be made with four or five topographs in simple cases. In an SL‐cut quartz resonator designed to operate at 455 kHz the principal mode is thereby shown to be third‐order fac
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