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Power of tests for some process capability indices

 

作者: Youn-Min Chou,   Alan Polansky,  

 

期刊: Communications in Statistics - Simulation and Computation  （Taylor Available online 1993）
卷期: Volume 22, issue 2  

页码: 523-544

 

ISSN:0361-0918

 

年代: 1993

 

DOI:10.1080/03610919308813107

 

出版商: Marcel Dekker, Inc.

 

关键词: process capability indices;tests of hypotheses;power;noncentral t-distribution;bivariate noncentral t-distribution

 

数据来源: Taylor

 

摘要:

Process capability indices CPU,CPL,and Cpk have been used to measure the capability of a process. Tests on determining thecapability of a process are presented.Critical values are given in order to determine whether a process is capable.For a given sample size and a given significance level,the power of each test is considered.Tables for critical values andpower values are also presented

 

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